Global Leading University
Analog & RF Circuit and System Research Center

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Jawad Yousaf, Doojin Lee, JunHee Han, Hosang Lee, Muhammad Faisal, Jeongeun Kim and Wansoo Nah

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저자 : Jawad Yousaf, Doojin Lee, JunHee Han, Hosang Lee, Muhammad Faisal, Jeongeun Kim and Wansoo Nah
논문명 : Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics
게재지 : MDPI Electronics
게재정보 : Vol. 8, No. 797, pp.1-18
게재일자 : 2019.07
분류 : SCI
연구실 : EMC