Jaeyong Cho, Byung-Sung Kim, Jonghyuck Jeong, Junseong Kim, Kibeom Kim, Karam Hwang, Hwiseob Lee, Se…
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작성자: 관리자 댓글: 0 조회수: 189 날짜: 2023-04-04본문
저자 : Jaeyong Cho, Byung-Sung Kim, Jonghyuck Jeong, Junseong Kim, Kibeom Kim, Karam Hwang, Hwiseob Lee, Seungil Jeung, Seungyoung Ahn
논문명 : A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity
게재지 : IEEE Microwave and Wireless Components Letters
게재정보 : Volume: 27, Issue: 10, pp : 936-938
게재일자 : 2017
분류 : SCI
연구실 : RFMD
논문명 : A Two-Line Time-Domain Gating Method for Characterization of Test Fixture With via Hole Discontinuity
게재지 : IEEE Microwave and Wireless Components Letters
게재정보 : Volume: 27, Issue: 10, pp : 936-938
게재일자 : 2017
분류 : SCI
연구실 : RFMD
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