| 782 |
Kwangho Kim, JunHee Han, Jangbom Chai, and Wansoo Nah |
Quantitative Analysis of Insulator Degradation in a Single Layer Solenoid by Renormalization of the Transmission Parameter |
MDPI Electronics |
Vol. 9, No. 11 |
2020.10 |
SCIE |
EMC |
| 781 |
J. Yousaf , M. Ghazal , H. Lee , M. Faisal , J. G. Yang & W. Nah |
Efficient assessment of well-stirred operation of reverberation chamber using coupling transfer gain functions |
Journal of Electromagnetic Waves and Applications |
Early access |
- |
SCIE |
EMC |
| 780 |
Jawad Yousaf, Hosang Lee, Muhammad Faisal, Han Junhee, Wansoo Nah, Hamayoun Shahwani, Syed Attique S… |
Design, analysis, and validation of Radio Research Agency reverberation chamber |
International Journal of Communication Systems |
Vol. 34, No. 3 |
2020.10 |
SCIE |
EMC |
| 779 |
Hosang Lee, Jawad Yousaf, Kwangho Kim, Seongjin Mun, Chanseok Hwang, and Wansoo Nah |
Analysis of Antenna Performance Degradation due to Coupled Electromagnetic Interference from Nearby Circuits |
IEICE Transactions on Electrionics |
Vol. E103-C, No. 3, pp. 110-118 |
2020.03 |
SCIE |
EMC |
| 778 |
Junsang Lee, Hosang Lee, Jungrae Ha, Minho Kim, Sangwon Yun, Yeongsik Kim, Wansoo Nah |
Modeling of Transfer Impedance in Automotive BCI Test System with Closed-loop Method |
IEICE Transactions on Communications |
Vol. E103-B, No. 4, pp. 405-414 |
2020.04 |
SCIE |
EMC |
| 777 |
Bo Pu, Jun Fan and Wansoo Nah |
Immunity Enhancement of the Power Distribution Network in Integrated Circuits With Coplanar Meander Lines in Package |
IEEE Transactions On Electromagnetic Compatibility |
Vol. 62, No. 5, pp. 2238-2246 |
2020.10 |
SCI |
EMC |
| 776 |
Jawad Yousaf, Doojin Lee, JunHee Han, Hosang Lee, Muhammad Faisal, Jeongeun Kim and Wansoo Nah |
Near-Field Immunity Test Method for Fast Radiated Immunity Test Debugging of Automotive Electronics |
MDPI Electronics |
Vol. 8, No. 797, pp.1-18 |
2019.07 |
SCI |
EMC |
| 775 |
J.S. LEE, J.R. HA, M.H. KIM, S.W. YUN, Y.S. KIM, and W. Nah |
Prediction of conducted emission in a PMSM-drive braking system using a circuit model combined with EM simulation |
International Journal of Automotive Technology |
Vol. 20, No. 3, pp. 487-498 |
2019.06 |
SCI-E |
EMC |
| 774 |
Jawad Yousaf, Muhammad Faisal, Jinsung Youn, and Wansoo Nah |
Design of experiment (DOE) Analysis of System Level ESD Noise Coupling to High-Speed Memory Modules |
MDPI Electronics |
Vol. 8 No. 210, pp. 1-25 |
2019.02 |
SCI-E |
EMC |
| 773 |
Jawad Yousad, Hosang Lee, Wansoo Nah |
System Level ESD Analysis: Acomprehensive 2 on ESD Coupling Analysis Techniques |
Jouranl of Electrical Engineering and Technology |
Vol. 13, No. 5, pp. 2033-2045 |
2018.09 |
SCI-E |
EMC |
